Full course description
Date: May 3-4, 2015
Location: SIS-TECH Solutions, Houston
Instructor: Mr. Bill Hearn
Credit: 1.4 CEUs/ 14 PDHs
These calculations must take into account the device failure rates, system architecture, subsystem voting configuration, specified diagnostics and testing, and repair times. The PFD calculation must also take into account the susceptibility of the SIF to common mode and common cause failure.
IEC 61511 requires that the PFD be verified by calculation to prove that each SIF meets its target Safety Integrity Level (SIL). This course provides students with an understanding of the fundamentals needed to address this requirement in their workplace. It familiarizes students with Failure Modes and Effects Analysis (FMEA), the identification of safe, dangerous, detected, and undetected device failures, the selection of failure rate data, understanding key design parameters, and applying the calculation methodology. The two approaches for approving a device for use in an SIS - certification and prior use - are also explained.
The course presents a series of examples as workshops to illustrate the important concepts and assumptions implicit in the calculations. The student must bring a scientific calculator and notepad to the course.
- Overview of the requirements in the SIS standards
- Failure analysis fundamentals
- Failure Modes and Effects Analysis (FMEA)
- Introduction to the math for probability of failure on demand and spurious trip rate
- Key elements affecting performance
- Workshops -- problems worked by students. Various cases will be modeled showing how changes to design and maintenance strategy affect results.
Price Structure and Promotional Codes:
- Regular Registration: $990
- Early Registration (MKOCEARLY2): $850
- Partner Consortium Member (MKOCPARTNER2): $595
- Sponsor Consortium Member (MKOCSPONSOR2): $795
- Associate Consortium Member (MKOCASSOC2): $895